Abstract: Wafer maps of large-scale integration chips are matrices showing the defective chip position on a wafer. Determining defect patterns on wafer maps is crucial because these patterns indicate ...

Since Philadelphia is arranged on a grid system, the mostly one-way roads are easy to navigate. Helpful maps are posted along street corners across the city – watch for the "Walk! Philadelphia" signs ...

This project explores automatic detection of scratch defects in semiconductor wafer maps using gradient-boosted trees (GBT/XGBoost). Scratches typically appear as linear tracks across adjacent dies, ...

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This is the open source version of Scratch 2.0 and the core code for the official version found on http://scratch.mit.edu. This code has been released under the GPL ...