Final electrical test remains one of the best ways to assess a circuit’s ultimate viability. But we know that, unfortunately, even 100% end-of-line electrical testing of semiconductor wafers will not ...

At-speed testing and delay defect analysis have become increasingly critical in ensuring the reliability and performance of modern integrated circuits. As circuit complexity grows alongside rapid ...

A newly drafted IEEE standard will bring more consistency to defect metrics in analog/mixed (AMS) designs, a long-overdue step that has become too difficult to ignore in the costly heterogeneous ...

This research introduced an innovative approach utilizing the electron wind force (EWF) to achieve defect annealing at significantly lower temperatures. The primary goal was to assess this method’s ...

“Speed is the new currency of business,” said Marc Benioff, CEO of Salesforce. In my experience, however, speed without quality is nothing but a fast track to failure. This delicate balance between ...