Writing correct concurrent programs is harder than writing sequential ones. This is because the set of potential risks and failure modes is larger - anything that can go wrong in a sequential program ...

Since the first transistors went into production almost six decades ago, semiconductor manufacturers have looked for ways to reduce test time and manufacturing costs. As the industry has grown from ...

Semiconductor manufacturers continue to look for ways to reduce the cost of test for producing mixed-signal SOC and SIP devices. Parallel test strategies, known as multisite test, implemented on ATE ...

Dave Armstrong, director of business development at Advantest, discusses the usefulness of concurrent test and describes how to maximize the value of this approach.

International Test Conference- Santa Clara, CA – Business Wire – October 25th, 2007 — Intellitech Corporation, www.intellitech.com, the leader in lowering electronic product costs through IEEE ...

Modern multithreaded, asynchronous code can be hard to debug. The complexity that comes with message passing and thread management results in bugs that can seem non-determinant, with little or no way ...

Teradyne at Productronica highlighted its new TestStation Duo concurrent in-circuit tester, which combines two complete and independent test modules inside a single tester frame to enable ...

Concurrent circulating tumor DNA and tissue-based testing identified more patients eligible for personalized cancer care than either of the tests done alone. There are two popular testing strategies ...

Value stream management involves people in the organization to examine workflows and other processes to ensure they are deriving the maximum value from their efforts while eliminating waste — of ...